The Diamondx test system extends LTX-Credence’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, consumer ASSP and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends LTXC’s leadership in lowering the cost of operations through:
• Small form-factor, zero footprint
• Air cooling – no heat exchanger and plumbing
• Low power consumption
The Diamondx test system is cost optimized for both today and future test requirements for a wide range of ASSP and microcontrollers in wireless and mobility applications and consumer ICs.The Diamondx brochure will provide you with an overview of the test system including detailed specifications and features.
Please submit your information and a copy of the Diamondx brochure will be sent to you shortly via email.